Search results for: Ming-Dou Ker
Microelectronics Reliability > 2011 > 51 > 8 > 1315-1324
Microelectronics Reliability > 2011 > 51 > 5 > 871-878
2011 International Reliability Physics Symposium > EL.2.1 - EL.2.2
IEEE Journal of Solid-State Circuits > 2011 > 46 > 2 > 537 - 545
EOS/ESD Symposium Proceedings > 1 - 6
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 207 - 218
IEEE Transactions on Electron Devices > 2011 > 58 > 9 > 2944 - 2951
Journal of Display Technology > 2011 > 7 > 12 > 657 - 664
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 3 > 474 - 483
Journal of Display Technology > 2011 > 7 > 2 > 62 - 69