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X‐ray emission spectroscopy (XES) is a powerful element‐selective tool to analyze the oxidation states of atoms in complex compounds, determine their electronic configuration, and identify unknown compounds in challenging environments. Until now the low efficiency of wavelength‐dispersive X‐ray spectrometer technology has limited the use of XES, especially in combination with weaker laboratory X‐ray...
We directly measure the optical gain and threshold current of lithographically-defined quantum dots. A peak groundstate gain of 1.8 cm−1 is determined. We also measure the recovery dynamics of the groundstate with the device biased above and below transparency using ultrafast differential transmission spectroscopy.
We demonstrate experimentally the advantages of driving laser-assisted photoemission from surfaces with long-wavelength-IR light. We show that applications in probing surface dynamics benefit from using longer-wavelengths since many side effects of strong fields are suppressed.
We present the first direct measurement of inner shell relaxation dynamics on complex systems, in this case an adsorbate on a surface. We measured a lifetime of 7fs for N-shell vacancies of Xe on Pt(111).
We present the first direct measurement of inner shell relaxation dynamics on complex systems, in this case an adsorbate on a surface. We measured a lifetime of 7 fs for N-shell vacancies of Xe on Pt(111).
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