Search results for: C. Svelto
Optics and Spectroscopy > 2019 > 127 > 4 > 656-663
Measurement > 2010 > 43 > 1 > 39-45
IEEE Transactions on Instrumentation and Measurement > 2009 > 58 > 5 > 1640 - 1649
IEEE Transactions on Instrumentation and Measurement > 2009 > 58 > 7 > 2087 - 2093
IEEE Transactions on Instrumentation and Measurement > 2008 > 57 > 1 > 48 - 54
IEEE Transactions on Instrumentation and Measurement > 2008 > 57 > 8 > 1713 - 1717
IEEE Transactions on Instrumentation and Measurement > 2008 > 57 > 8 > 1524 - 1528