Wyniki wyszukiwania dla: J. Schlessman
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 1 > 161 - 165
IEEE Design & Test of Computers > 2010 > 27 > 6 > 26 - 35
2008 Design, Automation and Test in Europe > 1220 - 1225
Proceedings of the IEEE > 2008 > 96 > 10 > 1576 - 1587