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Environmental and health concerns have resulted in significant activities to find substitutes for lead-contained solders for microelectronics. The potential candidates such as Sn-Ag1 and Sn-Ag-Cu1 eutectic solders with melting temperatures of 221?C and 217?C, respectively are the most prominent solders because of their excellent mechanical properties as compared with that of eutectic Sn-Pb solder2...
In this paper, we discuss a unique combination of experimental analyses employed to monitor, understand, and ultimately eliminate micro voids formation in the epoxy matrix of flip chip underfill during curing. Present day flip chip packages require the use of underfill epoxies to achieve reliable C4 bumps solder joints on the board level. Many different types of underfill epoxy chemistry have been...
RoHS Directive for environmental and health concerns have resulted in significant activities to find substitutes for lead-contained solders for microelectronics. The potential candidates such as Sn-Ag1 and Sn-Ag-Cu1 eutectic solders with melting temperatures of 221degC and 217degC, respectively are the most prominent solders because of their excellent mechanical properties as compared with that of...
A comparison study between Sn3.5Ag solder ball and conventional Sn3.8AgO.7Cu (SAC387) solder ball was conducted on 33??33 FCPBGA with SOP pad finishing. After assembly, samples were subjected to laser scanning for slanted ball inspection. Visual inspection under low power scope was done to check for wrinkled balls. Cold ball pull (CBP) was used to evaluate the solder joint strength at 4 conditions,...
A study was conducted to assess the backward compatibility of three different lead-free BGA components using Jedec Solderability testing method (JESD22-B102D). The test was conducted at component level. The three components tested were 29??29 mm Thermally Enhanced PBGA (TePBGA-II) and 35??35mm Tape BGA (TBGA) with SAC387 and Sn3.5Ag solder balls, as well as 33??33 mm Flip Chip HiCTE BGA with only...
A study was conducted to assess the backward compatibility of two different lead-free BGA components using Jedec Solderability testing method (JESD22-B102D). The test was conducted at component level. The two components tested were 29×29mm Thermally Enhanced PBGA (TePBGA-II) and 35×35mm Tape BGA (TBGA) with SAC387 and Sn3.5Ag solder balls. Four units from each of the two component types were used...
A study was conducted on BGA lead-free C5 solder joint system to compare SnAgNiCo versus conventional Sn3.8Ag0.7Cu solder alloy. This study showed that SnAgNiCo C5 solder system performed better than Sn3.8Ag0.7Cu in terms of joint strength and brittle mode failure. Shear and pull strength was measured by Dage which is representative of the intermetallic (IMC) strength between the C5 solder sphere...
In the recent years, lead-free solder material have been increasingly applied to the green semiconductor products for RoHS compliance. For Flip Chip Plastic Ball Grid Array (FCPBGA), recent industry trend is changing from ENIG pad finishing to Solder-on-pad (SOP) pad finishing using Sn3.0Ag0.5Cu to improve board level reliability due to black pad issue on ENIG pads. However, SOP has posted a challenge...
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