The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
New generation infra-red (IR) microscopy has been integrated with lock-in capability. The introduction of this function greatly improves the usability of this tool for fault localization. It is very useful in localizing defects that produce a heat source that is usually caused by metallization short or active damage. This paper presents three case studies to highlight the importance of using infra-red...
Soft defect localization (SDL) is an established fault isolation process for localizing soft defects using laser heating. This paper consolidates interesting analysis cases to identify good relation between SDL set-points and defect types that enables better approach in exposing such defects during physical analysis and reduce cause-not-founds.
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.