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Dark current spectroscopy is used to directly investigate deep-level traps induced by alpha particle irradiation in charge-coupled devices, at trap concentrations as low as ~2 times 107 cm-3. The irradiated devices have long dark current histogram tails that are quantized at long imager integration times. This quantization is due to the discrete nature of the distribution of the radiation-induced...
The authors report results obtained on a full-color interline transfer CCD (charged-coupled device) image sensor with pixel dimensions of 8.6 mu m(H)*6.8 mu m(V) using 1.2- mu m design rules and a two-phase, single-polysilicon-per-phase technology. In order to reduce image smear and to provide suitable topography for integral color filters, a refractory light shield with a flowed glass overlayer was...
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