Search results for: Yean-Kuen Fang
Solid-State Electronics > 2016 > 115 > PA > 7-11
IEEE Transactions on Electron Devices > 2015 > 62 > 3 > 988 - 993
Microelectronics Reliability > 2014 > 54 > 5 > 905-910
IEEE Electron Device Letters > 2014 > 35 > 9 > 954 - 956
Applied Physics A > 2014 > 116 > 4 > 1655-1660
Microelectronics Reliability > 2012 > 52 > 6 > 1055-1059
Microelectronics Reliability > 2012 > 52 > 2 > 425-429
IEEE Sensors Journal > 2012 > 12 > 5 > 978 - 983
IEEE Transactions on Electron Devices > 2012 > 59 > 6 > 1786 - 1791
Sensors & Actuators: B. Chemical > 2011 > 156 > 1 > 338-342
IEEE Sensors Journal > 2011 > 11 > 1 > 150 - 154
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 7 - 12
IEEE Sensors Journal > 2011 > 11 > 5 > 1227 - 1232
IEEE Transactions on Electron Devices > 2011 > 58 > 3 > 901 - 905