Search results for: Michael Huebner
Journal of Electronic Testing > 2019 > 35 > 2 > 173-189
Microprocessors and Microsystems > 2017 > 52 > C > 2-22
Lecture Notes in Electrical Engineering
European Radiology > 2014 > 24 > 8 > 2023-2030
Journal of Electronic Testing > 2019 > 35 > 2 > 173-189
Microprocessors and Microsystems > 2017 > 52 > C > 2-22
Lecture Notes in Electrical Engineering
European Radiology > 2014 > 24 > 8 > 2023-2030