Search results for: A. Lenk
Springer Proceedings in Physics > Microscopy of Semiconducting Materials > Self-Organised and Quantum Domain Structures > 319-322
Springer Proceedings in Physics > Microscopy of Semiconducting Materials > High Resolution Microscopy and Nanoanalysis > 213-216
Review of Managerial Science > 2008 > 2 > 2 > 129-160
Microelectronics Reliability > 2005 > 45 > 9-11 > 1558-1561
Applied Surface Science > 1997 > 109-110 > Complete > 419-423
Applied Surface Science > 1997 > 109-110 > Complete > 362-365
Applied Surface Science > 1996 > 96-98 > C > 195-198
Applied Surface Science > 1996 > 96-98 > C > 97-101
Applied Surface Science > 1996 > 96-98 > 195-198
Applied Surface Science > 1996 > 106 > 473-477
Applied Surface Science > 1996 > 96-98 > 97-101
Analytical and Bioanalytical Chemistry > 1995 > 353 > 3-4 > 333-336