Search results for: V. Pouget
Microelectronics Reliability > 2017 > 76-77 > C > 650-654
Microelectronics Reliability > 2017 > 76-77 > C > 644-649
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 427 - 433
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3564 - 3571
IEEE Transactions on Nuclear Science > 2014 > 61 > 4-1 > 1813 - 1818
Microelectronics Reliability > 2013 > 53 > 9-11 > 1315-1319
Microelectronics Reliability > 2013 > 53 > 9-11 > 1325-1328
Microelectronics Reliability > 2012 > 52 > 9-10 > 1816-1821
Microelectronics Reliability > 2012 > 52 > 9-10 > 2035-2038
2012 IEEE International Reliability Physics Symposium (IRPS) > FA.2.1 - FA.2.5
Microelectronics Reliability > 2011 > 51 > 9-11 > 1658-1661
IEEE Transactions on Nuclear Science > 2011 > 58 > 6-1 > 2637 - 2643
Microelectronics Reliability > 2009 > 49 > 9-11 > 1143-1147
Microelectronics Reliability > 2009 > 49 > 9-11 > 1175-1181