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The paper proposes a two-step scan cell partitioning scheme to identify the error-capturing scan cells in a scan-BIST environment. In the first step, a deterministic partitioning scheme is used, whose target is to maximize the correlations between different scan cells in fault diagnosis since different scan cells have very different probabilities of capturing fault effects. In the second step, a previously...
A full-speed field-programmable memory BIST controller is proposed. The proposed instruction and architecture designs enable full-speed operation of algorithms containing more than one level of looping.
A full-speed field-programmable memory BIST controller is proposed. The proposed instruction and architecture designs enable full-speed operation of not only March algorithms but also some non-linear algorithms that are becoming more and more important in modern memory testing, diagnosis, and failure analysis
The effectiveness of residue code checking for online error detection in parallel two's complement multipliers has only up until now been evaluated experimentally for few architectures. In this paper a formal analysis is given for most of the current multiplication schemes. Based on this analysis it is shown which check bases are appropriate, and how the original scheme has to be extended for complete...
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