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Typical test methods for characterizing the single event upset performance of an analog to digital converter (ADC) have involved holding the input at static values. As a result, output error signatures are seen for only a few input voltage and output codes. A test method using an input beat frequency and output code error detection allows an ADC to be characterized with a dynamic input at a high frequency...
Typical test methods for characterizing the single event upset performance of an analog to digital converter (ADC) have involved holding the input at static values. As a result, output error signatures are seen for only a few input voltage and output codes. A test method using an input beat frequency and output code error detection allows an ADC to be characterized with a dynamic input at a high frequency...
Typically, single event upset (SEU) testing of analog to digital converters (ADC) has been done with static inputs. A test method, using a beat frequency and code error detection software, is presented. This test method allows for SEU characterization of ultra high speed ADC's, using dynamic inputs that more closely reflect the operating conditions in a space application. The test method is demonstrated...
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