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Embedded memories are increasingly identified as having potential for introducing new yield loss mechanisms at a rate, magnitude, and complexity large enough to demand major changes in fault diagnosis techniques. In particular, time-related or complex read faults that originate in the highest density areas of semiconductor designs require new methods to diagnose more complex faults affecting large...
In the past, logic diagnosis was primarily used to support failure analysis labs. It was typically done on a small sample of defective chips, therefore long processing times, manual generation of diagnostic patterns, and usage of expensive equipment was acceptable. In addition to failure analysis, yield learning relied on test chips and in-line inspection. Recently, sub-wavelength lithography processes...
Summary form only given. In the past, logic diagnosis was primarily used to support failure analysis labs. It was typically done on a small sample of defective chips, therefore long processing times, manual generation of diagnostic patterns, and usage of expensive equipment was acceptable. In addition to failure analysis, yield learning relied on test chips and in-line inspection. Recently, sub-wavelength...
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