Search results for: J. Sune
Journal of Electronic Materials > 2018 > 47 > 9 > 5033-5038
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 12 > 2044 - 2051
Microelectronics Reliability > 2017 > 76-77 > C > 178-183
Microelectronic Engineering > 2017 > 178 > C > 10-16
Microelectronic Engineering > 2017 > 178 > C > 61-65
Lecture Notes in Physics > Statistical and Dynamical Aspects of Mesoscopic Systems > Contributions Presented as Posters > 327-328
Lecture Notes in Physics > Statistical and Dynamical Aspects of Mesoscopic Systems > Contributions Presented as Posters > 330-331
Microelectronic Engineering > 2015 > 147 > C > 37-40
Microelectronic Engineering > 2015 > 147 > C > 75-78
Microelectronic Engineering > 2015 > 147 > C > 85-88
IEEE Electron Device Letters > 2015 > 36 > 9 > 944 - 946
Solid-State Electronics > 2015 > 111 > C > 47-51
Microelectronics Reliability > 2015 > 55 > 9-10 > 1442-1445
IEEE Transactions on Nanotechnology > 2015 > 14 > 1 > 15 - 17
Microelectronics Reliability > 2015 > 55 > 1 > 1-14