Search results for: J. Huang
2015 IEEE International Electron Devices Meeting (IEDM) > 29.2.1 - 29.2.4
IEEE Electron Device Letters > 2015 > 36 > 4 > 294 - 296
2012 IEEE International Reliability Physics Symposium (IRPS) > 5D.3.1 - 5D.3.5
IEEE Electron Device Letters > 2012 > 33 > 1 > 20 - 22
2011 International Reliability Physics Symposium > 6B.3.1 - 6B.3.5
IEEE Electron Device Letters > 2011 > 32 > 9 > 1194 - 1196
IEEE Electron Device Letters > 2011 > 32 > 3 > 255 - 257
2010 International Electron Devices Meeting > 6.2.1 - 6.2.4
2010 International Electron Devices Meeting > 27.1.1 - 27.1.4