Search results for: T. Sudarshan
Clinical Radiology > 2016 > 71 > 10 > 1059-1065
Microelectronics Reliability > 2008 > 48 > 10 > 1664-1668
Journal of Electronic Materials > 2001 > 30 > 3 > 224-227
IEEE Transactions on Electrical Insulation > 1987 > EI-22 > 6 > 801 - 810
IEEE Transactions on Electrical Insulation > 1987 > EI-22 > 4 > 447 - 452
IEEE Transactions on Electrical Insulation > 1987 > EI-22 > 4 > 489 - 495
IEEE Transactions on Electrical Insulation > 1984 > EI-19 > 6 > 512 - 518
IEEE Transactions on Electrical Insulation > 1983 > EI-18 > 3 > 280 - 286
IEEE Transactions on Electrical Insulation > 1983 > EI-18 > 3 > 238 - 242
IEEE Transactions on Electrical Insulation > 1981 > EI-16 > 2 > 83 - 88
IEEE Transactions on Electrical Insulation > 1979 > EI-14 > 4 > 211 - 221
IEEE Transactions on Electrical Insulation > 1977 > EI-12 > 5 > 376 - 377
IEEE Transactions on Electrical Insulation > 1977 > EI-12 > 3 > 200 - 208
IEEE Transactions on Electrical Insulation > 1976 > EI-11 > 2 > 63 - 66