Search results for: L. Dusseau
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2054 - 2060
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2107 - 2114
IEEE Transactions on Nuclear Science > 2016 > 63 > 4-1 > 2168 - 2175
IEEE Transactions on Nuclear Science > 2016 > 63 > 4-1 > 2065 - 2071
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3458 - 3465
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3451 - 3457
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3043 - 3049
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3424 - 3431
IEEE Transactions on Nuclear Science > 2014 > 61 > 4-1 > 1603 - 1610
IEEE Transactions on Dielectrics and Electrical Insulation > 2014 > 21 > 3 > 1161 - 1165
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3201 - 3209
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3095 - 3102
Microelectronics Reliability > 2013 > 53 > 9-11 > 1306-1310
IEEE Transactions on Nuclear Science > 2013 > 60 > 6-1 > 4430 - 4438
IEEE Transactions on Nuclear Science > 2013 > 60 > 4-1 > 2542 - 2549