Search results for: Y.T. Yeow
Microelectronics Reliability > 2001 > 41 > 2 > 201-209
Microelectronic Engineering > 1995 > 28 > 1-4 > 257-260
Electronics Letters > 1993 > 29 > 4 > 418 - 420
Electronics Letters > 1979 > 15 > 20 > 630 - 632
Electronics Letters > 1976 > 12 > 5 > 125 - 127