Search results for: T. Devolder
Journal of Magnetism and Magnetic Materials > 2015 > 394 > C > 292-298
Microelectronics Reliability > 2012 > 52 > 9-10 > 1848-1852
IEEE Transactions on Magnetics > 2012 > 48 > 11 > 3811 - 3813
Microelectronics Reliability > 2011 > 51 > 9-11 > 1454-1458
physica status solidi (b) > 248 > 7 > 1615 - 1618
IEEE Transactions on Magnetics > 2011 > 47 > 6-1 > 1595 - 1598
IEEE Transactions on Magnetics > 2008 > 44 > 11-1 > 3265 - 3268
Journal of Magnetism and Magnetic Materials > 2006 > 307 > 2 > 325-329