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Spectral testing and linearity testing are two important categories in ADC testing. The sampling clock quality is a crucial factor in ADC spectral testing. The cumulative clock jitter of the sampling clock generates power leakage in the fundamental component of the ADC output spectrum, and the random clock jitter increases the noise floor of the ADC output spectrum, which corrupts the spectrum result...
Accurate spectral testing plays a crucial role in modern high-precision analog-to-digital converters’ (ADCs’) evaluation process. One of the challenges is to be able to cost-effectively test the continually higher resolution ADCs accurately. Due to its stringent test requirement, the standard test method for ADCs can be difficult to implement with low cost. This paper proposes an algorithm that relaxes...
A method for separating and accurately estimating ADC noise, aperture jitter, and clock jitter is presented for ADC testing and characterization. This significantly relaxes clock jitter requirements and removes the need for high precision test instruments, but still allows ADC specifications like SNR, SNDR and ENOB to be accurately estimated.
Clock jitter is a crucial factor in high speed and high performance Analog-to-Digital Converter (ADC) testing. Random clock jitter increases the noise floor in the ADC output spectrum making it difficult to obtain the true ADC Signal to Noise Ratio (SNR). Periodic Jitter generates spurs in the ADC output spectrum. Another well-known challenge is to achieve precise coherent sampling. This paper proposes...
Jitter is a crucial factor in high speed and high performance ADC testing. This paper proposes an efficient and accurate jitter estimation method based on one frequency measurement. Applying simple mathematical processing to the ADC output in time domain, the RMS of jitter and noise power are obtained. Furthermore, prior information of harmonics does not need to know before the processing. The algorithm...
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