Search results for: S. Lee
2010 International Electron Devices Meeting > 27.5.1 - 27.5.4
Electronics Letters > 2008 > 44 > 4 > 274 - 275
IEEE Transactions on Reliability > 1985 > R-34 > 3 > 194 - 203
2010 International Electron Devices Meeting > 27.5.1 - 27.5.4
Electronics Letters > 2008 > 44 > 4 > 274 - 275
IEEE Transactions on Reliability > 1985 > R-34 > 3 > 194 - 203