Search results for: A. Bouhdada
Microelectronics Reliability > 2004 > 44 > 2 > 223-228
Microelectronics Journal > 1998 > 29 > 11 > 813-816
Microelectronics Reliability > 1997 > 37 > 4 > 649-652
Microelectronics Journal > 1997 > 28 > 1 > 85-91
Microelectronics Reliability > 1996 > 36 > 5 > 661-665