Search results for: Y. Lin H.
Microelectronics Reliability > 1997 > 37 > 4 > 705
Solid State Electronics > 1996 > 39 > 7 > 1005-1009
Solid State Electronics > 1996 > 39 > 5 > 645-651
Microelectronics Reliability > 1997 > 37 > 4 > 705
Solid State Electronics > 1996 > 39 > 7 > 1005-1009
Solid State Electronics > 1996 > 39 > 5 > 645-651