Search results for: C.H. Kim
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 4 > 537 - 556
IEEE Journal of Solid-State Circuits > 2008 > 43 > 4 > 874 - 880
2007 44th ACM/IEEE Design Automation Conference > 370 - 375
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 4 > 537 - 556
IEEE Journal of Solid-State Circuits > 2008 > 43 > 4 > 874 - 880
2007 44th ACM/IEEE Design Automation Conference > 370 - 375