Search results for: Mohamed Chaker Zaghdoudi
Microelectronics Reliability > 2016 > 62 > C > 102-112
International Journal of Thermal Sciences > 2000 > 39 > 4 > 498-504
International Journal of Thermal Sciences > 2000 > 39 > 1 > 39-52
Revue Generale de Thermique > 1998 > 37 > 5 > 323-352