The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
A novel method for characterizing a single crystalline or poly-silicon solar photovoltaic (SPV) cell is proposed. The extraction of the parameters of an SPV cell is hindered by the presence of its leakage resistance. It is demonstrated here that in employing a negative resistance, not only the C-V characteristics but also the R-V characteristics along with the built-in potential and the doping concentration...
A novel method for obtaining the capacitance - voltage (C-V) characteristic of single crystalline or polycrystalline silicon solar photovoltaic (SPV) cells is demonstrated. Measurement of the C-V characteristics of an SPV cell is hindered by the presence of leakage resistance. The proposed method compensates the parallel leakage resistance of a SPV cell with the addition of a negative resistance of...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.