Search results for: Xianming Liu
Microelectronics Reliability > 2015 > 55 > 12(PB) > 2663-2670
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3715 - 3721
Microelectronics Reliability > 2015 > 55 > 12(PB) > 2663-2670
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3715 - 3721