Search results for: A.E. Hammad
Microelectronics Reliability > 2018 > 87 > C > 133-141
Microelectronics Reliability > 2017 > 75 > C > 187-194
Journal of Alloys and Compounds > 2014 > 614 > Complete > 20-28
Materials Science & Engineering A > 2014 > 608 > Complete > 130-138
Materials & Design > 2014 > 56 > C > 594-603
Journal of Electronic Materials > 2014 > 43 > 11 > 4146-4157
Materials & Design > 2013 > 52 > C > 966-973
Materials & Design > 2013 > 52 > C > 663-670
Materials and Design > 2013 > 50 > Complete > 108-116
Materials and Design > 2013 > 43 > Complete > 40-49
Materials and Design > 2012 > 40 > Complete > 292-298
Journal of Alloys and Compounds > 2011 > 509 > 34 > 8554-8560
Journal of Alloys and Compounds > 2011 > 509 > 26 > 7238-7246
Journal of Alloys and Compounds > 2010 > 505 > 2 > 793-800
Materials Science & Engineering A > 2010 > 527 > 20 > 5212-5219
Journal of Alloys and Compounds > 2009 > 471 > 1-2 > 98-104
IEEE Transactions on Power Apparatus and Systems > 1979 > PAS-98 > 6 > 1937 - 1946
01975 IEEE-MTT-S International Microwave Symposium > 1975 > 202 - 203