Search results for: Mahdi Fazeli
Integration, the VLSI Journal > 2010 > 43 > 3 > 268-278
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 208 - 221
Journal of Electronic Testing > 2008 > 24 > 1-3 > 21-33
Integration, the VLSI Journal > 2010 > 43 > 3 > 268-278
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 208 - 221
Journal of Electronic Testing > 2008 > 24 > 1-3 > 21-33