Search results for: K.L. Pey
Microelectronic Engineering > 2017 > 178 > C > 293-297
Microelectronic Engineering > 2017 > 178 > C > 308-312
2017 IEEE International Reliability Physics Symposium (IRPS) > 3C-1.1 - 3C-1.6
Microelectronics Reliability > 2016 > 64 > C > 204-209
Microelectronics Reliability > 2016 > 64 > C > 172-178
Microelectronics Reliability > 2016 > 61 > C > 78-81
Microelectronics Reliability > 2016 > 61 > C > 95-98
Microelectronics Reliability > 2015 > 55 > 9-10 > 1450-1455
2015 IEEE International Reliability Physics Symposium > 5A.2.1 - 5A.2.7
Microelectronics Reliability > 2014 > 54 > 9-10 > 1712-1717
2012 IEEE International Reliability Physics Symposium (IRPS) > 6A.1.1 - 6A.1.11
Journal of Electronic Materials > 2012 > 41 > 9 > 2533-2542
2011 International Electron Devices Meeting > 31.2.1 - 31.2.4