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This paper deals with the interpretation of noun compounds based on a word similarity method. The experiment results provide the most similar noun compounds for the unfamiliar ones. We suggest that these results could be used as a recommendation database of noun compounds for the native or foreign language learners.
As one of the most failure modes for MOSFET devices, the Au-Al failure mode is mainly caused by the Au-Al intermetallic compounds (IMC) growth. The IMC growth makes the bonding strength decrease and the contact resistance increase. In order to study the Au-Al bonding failure mode, the accelerated life tests were conducted, under three temperature conditions — 150°C, 175°C and 200°C. After the tests,...
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