Search results for: V.M. Dwyer
Microprocessors and Microsystems > 2016 > 47 > PB > 466-485
Microelectronics Reliability > 2013 > 53 > 9-11 > 1261-1265
Microelectronics Reliability > 2012 > 52 > 9-10 > 1960-1965
Microelectronics Reliability > 2011 > 51 > 9-11 > 1568-1572
Integration, the VLSI Journal > 2008 > 41 > 1 > 135-152
Physics Letters A > 1997 > 229 > 1 > 37-43