Search results for: Kenji Okada
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4386 - 4392
2017 IEEE International Reliability Physics Symposium (IRPS) > 5B-2.1 - 5B-2.5
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2268 - 2274
2016 IEEE International Reliability Physics Symposium (IRPS) > 3A-6-1 - 3A-6-6
2015 IEEE International Reliability Physics Symposium > 2A.4.1 - 2A.4.5