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The single-event sensitivity of bulk 40-nm sequential circuits is investigated as a function of temperature and supply voltage. An overall increase in SEU cross section versus temperature is observed at relatively high supply voltages. However, at low supply voltages, there is a threshold temperature beyond which the SEU cross section decreases with further increases in temperature. Single-event transient...
Single event sensitivity of bulk 40-nm sequential circuits is investigated as a function of temperature and supply voltage. The temperature dependence of single event upsets is different for relatively high supply voltage and ultra-low supply voltage. Single-event-transient induced errors in flip-flops are more sensitive to temperature variation than single event upsets.
We present a minimally invasive in situ delay-slack monitor that directly measures the timing margins on critical timing signals, allowing margins due to both global and local PVT variations to be removed.
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