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The DC high voltage is usually measured with high voltage divider which plays the role of the ratio standard linking the unknown high voltage (HV) to the well-known low voltage standard. Step-up method had been proposed to link the HV measurements to the low voltage standard. This paper describes the improved step-up technique, which employs an additional source voltage monitoring device. The monitoring...
An ac-dc resistor based on a silicon wafer is suggested. A resistance ratio is deduced from two resistances of the wafer given by van der Pauw theorem and Thompson-Lampard theorem. The ratio is a constant value, (π/ln2)2 and does not depend on electrical resistivity and other parameters. A simulation for dc current density to measure the two resistances was compared. Also, the two resistances were...
An evaluation technique and traceability for a DC-resistive high-voltage divider was established based on 1kV, which was traceable to a Josephson voltage standard at the Korea Research Institute of Standards and Science. To do this, the binary step-up method was used to evaluate the voltage-dividing ratio and the voltage coefficient of the divider up to 100kV. The expanded relative uncertainty for...
System for calibrating Rogowski coil(RC) up to primary current of 40,000 A have been established by employing standard current transformer(CT), CT comparator and voltage to current converter(VCC). The expanded uncertainty is 0.021 % ~ 0.230 % for ratio error and 0.3 min ~ 1.9 min for phase displacement in the primary current ranges of 10 ~ 40,000 A.
A calculable potential transformer (PT) with a nominal ratio error of -10 % to +10 % has been developed on basis of theoretical calculation of ratio error by the number of primary windings. The developed wide ratio error PT (WRE PT) can be used to evaluate the linearity and accuracy of the PT comparator by comparing both the theoretical and experimental values of the WRE PT. The WRE PT has been applied...
Both the ratio error and phase angle error of a current transformer (CT) are significantly affected by the CT burden connected in series to the secondary terminal of the CT. Thus, the precise measurement of this CT burden is required for the evaluation of the CT errors. A method for measuring the CT burden in-situ in a CT testing system (CTTS) has been developed by employing the non-reactive type...
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