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In the last years, the phenomenon of electronic products passing all tests by the manufacturer but failing in the field (No Fault Found, or NFF) attracted the attention of industries and researchers. Delay faults are supposed to be among the contributors to this phenomenon. Hence, companies are increasingly adopting functional test as a final step, which is expected to detect this kind of defects...
This paper first explores the effects of faults on circuits implemented with controllable-polarity transistors. We propose a new fault model that suits the characteristics of these devices, and report the results of a SPICE-based analysis of the effects of faults on the behavior of some basic gates implemented with them. Hence, we show that the considered devices are able to intrinsically tolerate...
Today, electronic devices are increasingly employed in different fields, including safety- and mission-critical applications, where the quality of the product is an essential requirement. In the automotive field, on-line self-test is a dependability technique currently demanded by emerging industrial standards. This paper presents an approach employed by STMicroelectronics for evaluating, or grading,...
Today, electronic devices are increasingly employed in different fields, including safety- and mission-critical applications, where the quality of the product is an essential requirement. In the automotive field, the Software-Based Self-Test is a dependability technique currently demanded by industrial standards. This paper presents an approach employed by STMicro electronics for evaluating, or grading,...
In this paper, the authors propose an algorithm to react to fault in the grid, this is based in block control scheme using sliding modes, for a double fed induction generator. In normal operation the electric torque and reactive power be controlled; when a fault occurs the electric torque and the stator current is controlled. The applicability of the proposed scheme is tested via simulations.
A table-based nonlinear approach was used to predict the performance of a commercially packaged Schottky diode. Excellent results have been obtained which improve those of the analytical model provided by the manufacturer. Both models were extensively validated under DC, small and large-signal one-tone and two-tone excitations. Measurements for table-based model extraction and models validation were...
Software-based self-test (SBST) is increasingly used for testing processor cores embedded in SoCs, mainly because it allows at-speed, low-cost testing, while requiring limited (if any) hardware modifications to the original design. However, the method requires effective techniques for generating suitable test programs and for monitoring the results. In the case of processor core testing, a particularly...
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