Search results for: R. Nema
Microelectronics Reliability > 1996 > 36 > 3 > 323-333
IEEE Transactions on Electrical Insulation > 1982 > EI-17 > 5 > 434 - 440
IEEE Transactions on Electrical Insulation > 1982 > EI-17 > 4 > 350 - 353
IEEE Transactions on Electrical Insulation > 1982 > EI-17 > 1 > 70 - 75
IEEE Transactions on Electrical Insulation > 1981 > EI-16 > 2 > 128 - 133