The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
The p-type indium antimonide (InSb) samples grown by the vertical directional solidification (VDS) technique were implanted with 2x10 13 , 1.8x10 14 and 1.5x10 15 30 keV Te + cm -2 at room temperature. The current-voltage (I-V) measurements on as-implanted and vacuum annealed samples were carried out at room temperature and at low temperatures...