Search results for: Yoon Ha
IEEE Electron Device Letters > 2015 > 36 > 10 > 994 - 996
IEEE Electron Device Letters > 2015 > 36 > 3 > 229 - 231
IEEE Electron Device Letters > 2014 > 35 > 7 > 702 - 704
IEEE Transactions on Electron Devices > 2013 > 60 > 9 > 2721 - 2727
IEEE Electron Device Letters > 2012 > 33 > 11 > 1517 - 1519
IEEE Electron Device Letters > 2012 > 33 > 11 > 1538 - 1540
IEEE Electron Device Letters > 2012 > 33 > 10 > 1348 - 1350
IEEE Electron Device Letters > 2012 > 33 > 9 > 1234 - 1236
2011 International Reliability Physics Symposium > 5A.4.1 - 5A.4.5
2011 International Reliability Physics Symposium > XT.1.1 - XT.1.5
IEEE Electron Device Letters > 2011 > 32 > 4 > 434 - 436
IEEE Electron Device Letters > 2011 > 32 > 11 > 1474 - 1476
IEEE Electron Device Letters > 2011 > 32 > 2 > 116 - 118