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In a modern multi-core SoC, the Built-In Speed Grading (BISG) of each logic core is often necessary in order to ensure an adequate operating margin for accommodating all kinds of variation (e.g., PVT variation), and to guide the dynamic VDD tuning process as well. In general, a speed grading method for a logic core can be performed by repeating a specific delay test session, (e.g., built-in self-test...
Most electronic components have high precision and expensive features and people used the drop test to determine the reliability of these electronic components effectively. This study focused on the drop test of FR-4 test board according to the JEDEC standard, to understand the test board's basic mechanical properties and variations of stress and strain on test board. This study used finite element...
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