Search results for: Shanshan Liu
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 802 - 804
IEEE Transactions on Reliability > 2017 > 66 > 2 > 518 - 528
Electronics Letters > 2016 > 52 > 23 > 1922 - 1923
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 269 - 271
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 4 > 1603 - 1606