Search results for: T. Jung
2013 IEEE International Electron Devices Meeting > 31.2.1 - 31.2.4
IEEE Journal of Solid-State Circuits > 2006 > 41 > 8 > 1772 - 1783
2013 IEEE International Electron Devices Meeting > 31.2.1 - 31.2.4
IEEE Journal of Solid-State Circuits > 2006 > 41 > 8 > 1772 - 1783