Search results for: J. Mikołajczyk
Opto-Electronics Review > 2018 > Vol. 26, No. 2 > 122--133
Metrology and Measurement Systems > 2016 > Vol. 23, nr 2 > 205--224
Metrology and Measurement Systems > 2016 > Vol. 23, nr 3 > 481--489
Opto-Electronics Review > 2018 > Vol. 26, No. 2 > 122--133
Metrology and Measurement Systems > 2016 > Vol. 23, nr 2 > 205--224
Metrology and Measurement Systems > 2016 > Vol. 23, nr 3 > 481--489