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Przedmiotem artykułu są nowe, przydatne do zastosowań w testerach wbudowanych BIST, specjalizowane sieci neuronowe do lokalizacji uszkodzeń parametrycznych analogowych układów elektronicznych, o podwyższonej odporności na maskujący wpływ rozrzutów tolerancyjnych elementów nieuszkodzonych. Sieci opracowane zostały w dwóch wariantach: z Dwucentrowymi Radialnymi (DRB) oraz Elipsoidalnymi (DEB) funkcjami...
In the paper a new fault diagnosis-oriented neural network and a diagnostic method for localization of parametric faults in Analog Electronic Circuits (AECs) with tolerances is presented. The method belongs to the class of dictionary Simulation Before Test (SBT) methods. It utilizes dictionary fault signatures as a family of identification curves dispersed around nominal positions by component tolerances...
This paper presents a Built-In Test (BIT) scheme intended for detection of nonlinearities, classification of the form of nonlinearity and evaluation of the total harmonic distortion (THD) of the signal under test, without using expensive automatic test equipment (ATE). The tester is based on a sigma-delta modulator located on a board and artificial neural networks implemented in an attached personal...
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