Search results for: C. Yang
IEEE Electron Device Letters > 2014 > 35 > 5 > 572 - 574
2013 IEEE International Reliability Physics Symposium (IRPS) > 3F.4.1 - 3F.4.6
IEEE Electron Device Letters > 2012 > 33 > 4 > 588 - 590
IEEE Electron Device Letters > 2011 > 32 > 4 > 560 - 562
IEEE Electron Device Letters > 2011 > 32 > 2 > 200 - 202
IEEE Electron Device Letters > 2011 > 32 > 6 > 806 - 808
IEEE Electron Device Letters > 2010 > 31 > 7 > 722 - 724
IEEE Electron Device Letters > 2010 > 31 > 7 > 728 - 730