The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
W artykule przedstawiono i omówiono wyniki badań dotyczące wpływu wybranych parametrów technologicznych procesu koagulacji takich jak : rodzaj i dawka koagulantu, temperatura oczyszczanej wody, czas i szybkość mieszania podczas flokulacji na skuteczność usuwania zanieczyszczeń z wody podziemnej. Analiza wyników badań wykazała, że skuteczność testowanych koagulantów w usuwaniu zanieczyszczeń z wody...
The IMFP of electrons is a fundamental material parameter of surface analysis by AES, XPS, EPES and EELS. In surface analysis calculated IMFP values are used. Their experimental determination is rather difficult. The IMFP of amorphous Ge and polycrystalline Si was determined by comparing the elastic peak intensity ratios with electrolytic Ni reference sample of 1 nm surface roughness, achieved by...
Backscattered electron (BSE) profiles from single interfaces in bulk cross-section semiconductor specimens are distorted by a dip and bump effect. A deconvolution/convolution method was recently developed [Konkol et al., Ultramicroscopy 55 (1994) 183] to eliminate these distortions, improve the resolution and produce correct composition profiles. This method is now applied to multilayer...
Hydrogen is found to influence the porous Si/PSi system. H atoms cannot be detected by AES or XPS, but profound effects have been observed on PSi using the elastic peak electron spectroscopy (EPES) in the 50-100 eV range after HF treatment of PSi samples. Limited numbers of low energy cross sections are available in the literature. The data of Joy et al are confined to 20 and 50 eV. The differential...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.