Search results for: J. Chen
IEEE Electron Device Letters > 2018 > 39 > 1 > 59 - 62
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 207 - 214
IEEE Electron Device Letters > 2017 > 38 > 9 > 1282 - 1285
IEEE Transactions on Power Electronics > 2017 > 32 > 8 > 6416 - 6433
IEEE Transactions on Power Electronics > 2017 > 32 > 7 > 5539 - 5549
IEEE Electron Device Letters > 2017 > 38 > 7 > 929 - 932
IEEE Transactions on Electron Devices > 2017 > 64 > 6 > 2592 - 2598
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 432 - 437
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 779 - 795
IEEE Electron Device Letters > 2016 > 37 > 12 > 1617 - 1620
IEEE Electron Device Letters > 2016 > 37 > 11 > 1458 - 1461
IEEE Transactions on Electron Devices > 2016 > 63 > 7 > 2831 - 2837
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2469 - 2473
IEEE Electron Device Letters > 2016 > 37 > 3 > 265 - 268
IEEE Electron Device Letters > 2016 > 37 > 2 > 157 - 160
IEEE Transactions on Electron Devices > 2016 > 63 > 1 > 106 - 112
IEEE Electron Device Letters > 2015 > 36 > 12 > 1287 - 1290
IEEE Transactions on Electron Devices > 2015 > 62 > 10 > 3215 - 3222
IEEE Transactions on Electron Devices > 2015 > 62 > 8 > 2475 - 2480
IEEE Electron Device Letters > 2015 > 36 > 8 > 754 - 756