The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
This paper illustrates the implementation of various X-ray techniques for the characterization of SiGe and high K metal gate films, including HRXRD, XRR, XPS. Parameters of interest such as strain, thickness, composition could be determined by corresponding technique. The strength and drawback of each technique are presented. Repeatability tests were performed in order to check the measurement tool...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.