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As processes shrink, the on-chip variability grows and this variation causes clock skew to rapidly consume a larger-and-larger percentage of the clock period. New techniques to reduce skew are required, but post-silicon clock adjustments will still be necessary to compensate for intra-die PVT variations. A relatively new technique for skew reduction, called Single-Edge Clocking (SEC), focuses clock...
Synchronous clock distribution continues to be the dominant timing methodology for VLSI designs. As processes shrink, clock speeds increase, and die sizes grow, more-and-more of the clock period is lost to skew and jitter budgets. We propose to improve clock performance by focusing on the single, critical clock edge while relaxing requirements of the non-critical edge. A novel re-design of the traditional...
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